Home An Analysis of AC- gm Dispersions due to Traps in Nitride Storage Layer in 3-D NAND Flash Memory
기간
2016
참가자
Ho Jung Kang
대회명
제 23회 한국반도체학술대회
An Analysis of AC- gm Dispersions due to Traps in Nitride Storage Layer in 3-D NAND Flash Memory
