Analysis of stress-induced traps generation on random telegraph noise for TANOS(TaN-Al2O3-Si3N4-SiO2-si) NAND flash memories
기간
2013
참가자
Byeong-In Choe
대회명
Korean Conference on Semiconductors
Analysis of stress-induced traps generation on random telegraph noise for TANOS(TaN-Al2O3-Si3N4-SiO2-si) NAND flash memories