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Analyzation of Positive Feedback device with Steep Subthreshold Swing Characteristics in 14 nm FinFET Technology

기간

2019

참가자

Sung Yun Woo

대회명

2019 Electron Devices Technology and Manufacturing Conference (EDTM)

Analyzation of Positive Feedback device with Steep Subthreshold Swing Characteristics in 14 nm FinFET Technology