Home Characterization of low frequency noise in PtSi Source/Drain Schottky Barrier Junction SOI MOSFETs
기간
2013
참가자
Jong-Ho Bae
대회명
제 20회 한국반도체학술대회
Characterization of low frequency noise in PtSi Source/Drain Schottky Barrier Junction SOI MOSFETs
