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Comparison of DC, Fast I-V, and Pulsed I-V measurement method in multi-layer WSe2 field effect transistors

기간

2016

참가자

Jun-Mo Park

대회명

International Conference on Electronics, Information, and Communication (ICEIC) 2016

Comparison of DC, Fast I-V, and Pulsed I-V measurement method in multi-layer WSe2 field effect transistors