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Extracting Accurate Position and Energy Level of Oxide Trap Generating Random Telegraph Noise(RTN) in Recessed Channel MOSFET’s

기간

2010

참가자

Sunyoung Park

대회명

2010 European Solid-State Device Research Confernece

Extracting Accurate Position and Energy Level of Oxide Trap Generating Random Telegraph Noise(RTN) in Recessed Channel MOSFET’s