Home Static Noise Margin of the Full DG-CMOS SRAM Cell Using Bulk FinFETs (OMEGA MOSFETs)
기간
2003
참가자
T. Park
대회명
2003 IEEE International Electron Devices Meeting
Static Noise Margin of the Full DG-CMOS SRAM Cell Using Bulk FinFETs (OMEGA MOSFETs)
