Home A Simulation Study on Reducing the Grain Boundary Position Dependency in Tunneling Thin-Film Transistors Using a Wide Tunneling Area
저자
Hyun-Min Kim et al.
저널 정보
Nanoscience and Nanotechnology Letters
출간연도
2020
링크
https://doi.org/10.1166/jnn.2020.18765
A Simulation Study on Reducing the Grain Boundary Position Dependency in Tunneling Thin-Film Transistors Using a Wide Tunneling Area