A Subthreshold Slope and Low-frequency Noise Characteristics in Charge Trap Flash Memories with Gate-All-Around and Planar Structure
저자
Myoung-Sun Lee et al.
저널 정보
JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
출간연도
2012
A Subthreshold Slope and Low-frequency Noise Characteristics in Charge Trap Flash Memories with Gate-All-Around and Planar Structure