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Home An anomalous device degradation of SOI narrow width devices caused by STI edge influence

Home An anomalous device degradation of SOI narrow width devices caused by STI edge influence

An anomalous device degradation of SOI narrow width devices caused by STI edge influence

저자

Hyeokjae Lee et al.

저널 정보

IEEE Transactions on Electron Devices

출간연도

2002

링크

https://doi.org/10.1109/16.992869

An anomalous device degradation of SOI narrow width devices caused by STI edge influence