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서울대학교 이종호 교수님 연구실Semiconductor Materials and Devices Laboratory

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Home Analysis of Current Fluctuation Due to Trap and Percolation Path in Nano-Scale Bulk FinFET

Home Analysis of Current Fluctuation Due to Trap and Percolation Path in Nano-Scale Bulk FinFET

Analysis of Current Fluctuation Due to Trap and Percolation Path in Nano-Scale Bulk FinFET

저자

Kyu-Bong Choi et al.

저널 정보

Journal of Nanoscience and Nanotechnology

출간연도

2016

링크

https://doi.org/10.1166/jnn.2016.12240

Analysis of Current Fluctuation Due to Trap and Percolation Path in Nano-Scale Bulk FinFET