Analysis on New Read Disturbance Induced by Hot Carrier Injections in 3-D Channel-Stacked NAND Flash Memory
저자
Dae woong Kwon et al.
저널 정보
IEEE Transactions on Electron Devices
출간연도
2019
Analysis on New Read Disturbance Induced by Hot Carrier Injections in 3-D Channel-Stacked NAND Flash Memory