Home Bias-Stress-Induced instabilities in P-Type Cu2O thin-film transistors
저자
Ick-Joon Park et al.
저널 정보
IEEE ELECTRON DEVICE LETTERS
출간연도
2013
링크
https://doi.org/10.1109/LED.2013.2253758
Bias-Stress-Induced instabilities in P-Type Cu2O thin-film transistors
