Border trap characterization in amorphous indium-gallium-zinc oxide thin-film transistors with SiOX and SiNX gate dielectrics
저자
Chan-Yong Jeong et al.
저널 정보
Applied Physics Letters
출간연도
2013
Border trap characterization in amorphous indium-gallium-zinc oxide thin-film transistors with SiOX and SiNX gate dielectrics