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서울대학교 이종호 교수님 연구실Semiconductor Materials and Devices Laboratory

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Home Conduction and Low-Frequency Noise Analysis in Al/α-TiOX/Al Bipolar Switching Resistance Random Access Memory Devices

Home Conduction and Low-Frequency Noise Analysis in Al/α-TiOX/Al Bipolar Switching Resistance Random Access Memory Devices

Conduction and Low-Frequency Noise Analysis in Al/α-TiOX/Al Bipolar Switching Resistance Random Access Memory Devices

저자

Jung-Kyu Lee et al.

저널 정보

IEEE Electron Device Letters

출간연도

2010

링크

https://doi.org/10.1109/LED.2010.2046010

Conduction and Low-Frequency Noise Analysis in Al/α-TiOX/Al Bipolar Switching Resistance Random Access Memory Devices