Home Device Design Consideration for 50nm Dynamic Random Access Memory Using Bulk FinFET
저자
Kyoung-Rok Han et al.
저널 정보
Japanese Journal of Applied Physics
출간연도
2005
링크
https://doi.org/10.1143/JJAP.44.2176
Device Design Consideration for 50nm Dynamic Random Access Memory Using Bulk FinFET
