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서울대학교 이종호 교수님 연구실Semiconductor Materials and Devices Laboratory

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Home Dynamic pass bias control for temperature-resilient neural networks using vertical NAND flash memory

Home Dynamic pass bias control for temperature-resilient neural networks using vertical NAND flash memory

Dynamic pass bias control for temperature-resilient neural networks using vertical NAND flash memory

저자

Sung-Ho Park et al.

저널 정보

Nano Convergence

출간연도

2025

링크

https://doi.org/10.1186/s40580-025-00513-1

Dynamic pass bias control for temperature-resilient neural networks using vertical NAND flash memory