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서울대학교 이종호 교수님 연구실Semiconductor Materials and Devices Laboratory

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Home Effects of Gate/Blocking Oxide Energy Barrier on Memory Characteristics in Charge Trap Flash Memory Cells

Home Effects of Gate/Blocking Oxide Energy Barrier on Memory Characteristics in Charge Trap Flash Memory Cells

Effects of Gate/Blocking Oxide Energy Barrier on Memory Characteristics in Charge Trap Flash Memory Cells

저자

Dong hua Li et al.

저널 정보

Nanoscience and Nanotechnology Letters

출간연도

2015

링크

https://doi.org/10.1166/nnl.2015.2002

Effects of Gate/Blocking Oxide Energy Barrier on Memory Characteristics in Charge Trap Flash Memory Cells