바로가기 메뉴: 본문 바로가기; 푸터 바로가기

서울대학교 이종호 교수님 연구실Semiconductor Materials and Devices Laboratory

사이트맵

TOP

Home Effects of High-Pressure Annealing on the Low-Frequency Noise Characteristics in Ferroelectric FET

Home Effects of High-Pressure Annealing on the Low-Frequency Noise Characteristics in Ferroelectric FET

Effects of High-Pressure Annealing on the Low-Frequency Noise Characteristics in Ferroelectric FET

저자

Wonjun Shin et al.

저널 정보

IEEE Electron Device Letters

출간연도

2021

링크

https://doi.org/10.1109/LED.2021.3127175

Effects of High-Pressure Annealing on the Low-Frequency Noise Characteristics in Ferroelectric FET