Home Examination of Ferroelectric Domain Dynamics in HZO Under Endurance Cycling Stress
저자
Ryun-Han Koo
저널 정보
IEEE Electron Device Letters
출간연도
2024
링크
https://doi.org/10.1109/LED.2024.3390090
Examination of Ferroelectric Domain Dynamics in HZO Under Endurance Cycling Stress
