Home Extraction of Interface Trap Density in the Region Between Adjacent Wordlines in NAND Flash Memory Strings
저자
Ho-Jung Kang et al.
저널 정보
IEEE Electron Device Letters
출간연도
2015
링크
https://doi.org/10.1109/LED.2014.2367025
Extraction of Interface Trap Density in the Region Between Adjacent Wordlines in NAND Flash Memory Strings