바로가기 메뉴: 본문 바로가기; 푸터 바로가기

서울대학교 이종호 교수님 연구실Semiconductor Materials and Devices Laboratory

사이트맵

TOP

Home Extraction of trap location and energy from random telegraph noise in amorphous TiOx resistance random access memories

Home Extraction of trap location and energy from random telegraph noise in amorphous TiOx resistance random access memories

Extraction of trap location and energy from random telegraph noise in amorphous TiOx resistance random access memories

저자

Jung-Kyu Lee et al.

저널 정보

Applied Physics Letters

출간연도

2011

링크

https://doi.org/10.1063/1.3575572

Extraction of trap location and energy from random telegraph noise in amorphous TiOx resistance random access memories