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서울대학교 이종호 교수님 연구실Semiconductor Materials and Devices Laboratory

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Home Improvement of Long-Term Durability and Bias Stress Stability in p-Type SnO Thin-Film Transistors Using a SU-8 Passivation Layer

Home Improvement of Long-Term Durability and Bias Stress Stability in p-Type SnO Thin-Film Transistors Using a SU-8 Passivation Layer

Improvement of Long-Term Durability and Bias Stress Stability in p-Type SnO Thin-Film Transistors Using a SU-8 Passivation Layer

저자

Young-Joon Han et al.

저널 정보

IEEE Electron Device Letters

출간연도

2014

링크

https://doi.org/10.1109/LED.2014.2363879

Improvement of Long-Term Durability and Bias Stress Stability in p-Type SnO Thin-Film Transistors Using a SU-8 Passivation Layer