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Improvement of Resistive Switching Characteristics of Titanium Oxide Based Nanowedge RRAM Through Nickel Silicidation

저자

Dong Keun Lee et al.

저널 정보

IEEE Transactions on Electron Devices

출간연도

2020

Improvement of Resistive Switching Characteristics of Titanium Oxide Based Nanowedge RRAM Through Nickel Silicidation