Home Low-Frequency Noise Degradation Caused by STI Interface Effects in SOI-MOSFETs
저자
Hyeokjae Lee et al.
저널 정보
IEEE Electron Device Letters
출간연도
2001
링크
https://doi.org/10.1109/55.944336
Low-Frequency Noise Degradation Caused by STI Interface Effects in SOI-MOSFETs
