Home Negative Bias Temperature Instability of Bulk Fin Field Effect Transistor
저자
Sang-Yun Kim et al.
저널 정보
JapaneseJournalofAppliedPhysics
출간연도
2005
링크
https://doi.org/10.1143/JJAP.45.1467
Negative Bias Temperature Instability of Bulk Fin Field Effect Transistor
