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서울대학교 이종호 교수님 연구실Semiconductor Materials and Devices Laboratory

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Home Noise Fingerprints as a Quantitative Order Parameter for Polarization- and Defect-Mediated Switching in Hafnia Ferroelectrics

Home Noise Fingerprints as a Quantitative Order Parameter for Polarization- and Defect-Mediated Switching in Hafnia Ferroelectrics

Noise Fingerprints as a Quantitative Order Parameter for Polarization- and Defect-Mediated Switching in Hafnia Ferroelectrics

저자

Ryun Han Koo et al.

저널 정보

Advanced Science

출간연도

2026

링크

https://advanced.onlinelibrary.wiley.com/doi/full/10.1002/advs.202519391

Noise Fingerprints as a Quantitative Order Parameter for Polarization – and Defect-Mdiated Switching in Hafina Ferroelectrics