Home Optimizing Post-Metal Annealing Temperature Considering Different Resistive Switching Mechanisms in Ferroelectric Tunnel Junction
저자
Ryun-Han Koo et al.
저널 정보
IEEE Electron Device Letters
출간연도
2023
링크
https://doi.org/10.1109/LED.2023.3267771
Optimizing Post-Metal Annealing Temperature Considering Different Resistive Switching Mechanisms in Ferroelectric Tunnel Junction