바로가기 메뉴: 본문 바로가기; 푸터 바로가기

서울대학교 이종호 교수님 연구실Semiconductor Materials and Devices Laboratory

사이트맵

TOP

Home Phenomenological analysis of random telegraph noise in amorphous TiOx-based bipolar resistive switching random access memory devices

Home Phenomenological analysis of random telegraph noise in amorphous TiOx-based bipolar resistive switching random access memory devices

Phenomenological analysis of random telegraph noise in amorphous TiOx-based bipolar resistive switching random access memory devices

저자

Jung-Kyu Lee et al.

저널 정보

Journal of Nanoscience and Nanotechnology

출간연도

2012

링크

https://doi.org/10.1166/jnn.2012.6249

Phenomenological analysis of random telegraph noise in amorphous TiOx-based bipolar resistive switching random access memory devices