Home Recovery of off-state stress-induced damage in FET-type gas sensor using self-curing method
저자
Wonjun Shin et al.
저널 정보
Discovery Nano
출간연도
2023
링크
https://doi.org/10.1186/s11671-023-03801-z
Recovery of off-state stress-induced damage in FET-type gas sensor using self-curing method
