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서울대학교 이종호 교수님 연구실Semiconductor Materials and Devices Laboratory

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Home Relationship Between Conduction Mechanism and Low-Frequency Noise in Polycrystalline-TiOx-Based Resistive-Switching Memory Devices

Home Relationship Between Conduction Mechanism and Low-Frequency Noise in Polycrystalline-TiOx-Based Resistive-Switching Memory Devices

Relationship Between Conduction Mechanism and Low-Frequency Noise in Polycrystalline-TiOx-Based Resistive-Switching Memory Devices

저자

Jung-Kyu Lee et al.

저널 정보

IEEE ELECTRON DEVICE LETTERS

출간연도

2012

링크

https://doi.org/10.1109/LED.2012.2196670

Relationship Between Conduction Mechanism and Low-Frequency Noise in Polycrystalline-TiOx-Based Resistive-Switching Memory Devices