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서울대학교 이종호 교수님 연구실Semiconductor Materials and Devices Laboratory

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Home Reliability of bottom-gate graphene field-effect transistors prepared by using inductively coupled plasma-chemical vapor deposition

Home Reliability of bottom-gate graphene field-effect transistors prepared by using inductively coupled plasma-chemical vapor deposition

Reliability of bottom-gate graphene field-effect transistors prepared by using inductively coupled plasma-chemical vapor deposition

저자

Jung-Kyu Lee et al.

저널 정보

Applied Physics Letters

출간연도

2011

링크

https://doi.org/10.1063/1.3589120

Reliability of bottom-gate graphene field-effect transistors prepared by using inductively coupled plasma-chemical vapor deposition