Home Suppression of Read Disturb Fail Caused by Boosting Hot Carrier Injection Effect for 3-D Stack NAND Flash Memories
저자
Byeong-In Choe et al.
저널 정보
EEE Electron Device Letters
출간연도
2014
링크
https://doi.org/10.1109/LED.2013.2288991
Suppression of Read Disturb Fail Caused by Boosting Hot Carrier Injection Effect for 3-D Stack NAND Flash Memories