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서울대학교 이종호 교수님 연구실Semiconductor Materials and Devices Laboratory

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Home Trap Profiling in Nitride Storage Layer in 3-D NAND Flash Memory Using Retention Characteristics and AC- gm Method

Home Trap Profiling in Nitride Storage Layer in 3-D NAND Flash Memory Using Retention Characteristics and AC- gm Method

Trap Profiling in Nitride Storage Layer in 3-D NAND Flash Memory Using Retention Characteristics and AC- gm Method

저자

Min-Kyu Jeong et al.

저널 정보

IEEE Electron Device Letters

출간연도

2015

링크

https://doi.org/10.1109/LED.2015.2419277

Trap Profiling in Nitride Storage Layer in 3-D NAND Flash Memory Using Retention Characteristics and AC- gm Method