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서울대학교 이종호 교수님 연구실Semiconductor Materials and Devices Laboratory

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Unraveling Threshold Voltage Instability in Ferroelectric Junctionless FETs Using Low-Frequency Noise Measurement With Base Bias

Unraveling Threshold Voltage Instability in Ferroelectric Junctionless FETs Using Low-Frequency Noise Measurement With Base Bias

저자

Wonjun Shin et al.

저널 정보

IEEE Electron Device Letters

출간연도

2023

링크

https://doi.org/10.1109/LED.2023.3310573

Unraveling Threshold Voltage Instability in Ferroelectric Junctionless FETs Using Low-Frequency Noise Measurement With Base Bias