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서울대학교 이종호 교수님 연구실Semiconductor Materials and Devices Laboratory

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Home Variability analysis of ferroelectric FETs in program operation using low-frequency noise spectroscopy

Home Variability analysis of ferroelectric FETs in program operation using low-frequency noise spectroscopy

Variability analysis of ferroelectric FETs in program operation using low-frequency noise spectroscopy

저자

Wonjun Shin et al.

저널 정보

Applied Physics Letters

출간연도

2022

링크

https://doi.org/10.1063/5.0111309

Variability analysis of ferroelectric FETs in program operation using low-frequency noise spectroscopy