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Design Consideration of Bulk FinFETs Devices With n+/p+/n+ Gate and p+/n+ Gate for Sub-50-nm DRAM Cell Transistors

저자

Ki-Heung Park et al.

저널 정보

IEEE TRANSACTIONS ON NANOTECHNOLOGY

출간연도

2008

Design Consideration of Bulk FinFETs Devices With n+/p+/n+ Gate and p+/n+ Gate for Sub-50-nm DRAM Cell Transistors