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서울대학교 이종호 교수님 연구실Semiconductor Materials and Devices Laboratory

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Home Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors

Home Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors

Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors

저자

Jeong-Min Lee et al.

저널 정보

Applied Physics Letters

출간연도

2008

링크

https://doi.org/10.1063/1.2977865

Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors