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서울대학교 이종호 교수님 연구실Semiconductor Materials and Devices Laboratory

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Home Impacts of Program/Erase Cycling on the Low-Frequency Noise Characteristics of Reconfigurable Gated Schottky Diodes

Home Impacts of Program/Erase Cycling on the Low-Frequency Noise Characteristics of Reconfigurable Gated Schottky Diodes

Impacts of Program/Erase Cycling on the Low-Frequency Noise Characteristics of Reconfigurable Gated Schottky Diodes

저자

Wonjun Shin et al.

저널 정보

IEEE Electron Device Letters

출간연도

2021

링크

https://doi.org/10.1109/LED.2021.3072915

Impacts of Program/Erase Cycling on the Low-Frequency Noise Characteristics of Reconfigurable Gated Schottky Diodes