Modeling of asymmetric degradation based on a non-uniform electric field and temperature in amorphous In–Ga–Zn–O thin film transistors
저자
Jong In Kim et al.
저널 정보
Semiconductor Science and Technology
출간연도
2017
Modeling of asymmetric degradation based on a non-uniform electric field and temperature in amorphous In–Ga–Zn–O thin film transistors