Observation of Slow Oxide Traps at MOSFETs Having Metal/High-k Gate Dielectric Stack in Accumulation Mode
저자
Heung-Jae Cho et al.
저널 정보
IEEE Transactions on Electron Devices
출간연도
2010
Observation of Slow Oxide Traps at MOSFETs Having Metal/High-k Gate Dielectric Stack in Accumulation Mode