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서울대학교 이종호 교수님 연구실Semiconductor Materials and Devices Laboratory

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Home Study on Time Constants of Random Telegraph Noise in Gate Leakage Current Through Hot-Carrier Stress Test

Home Study on Time Constants of Random Telegraph Noise in Gate Leakage Current Through Hot-Carrier Stress Test

Study on Time Constants of Random Telegraph Noise in Gate Leakage Current Through Hot-Carrier Stress Test

저자

Heung-Jae Cho et al.

저널 정보

IEEE Electron Device Letters

출간연도

2010

링크

https://doi.org/10.1109/LED.2010.2053694

Study on Time Constants of Random Telegraph Noise in Gate Leakage Current Through Hot-Carrier Stress Test