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서울대학교 이종호 교수님 연구실Semiconductor Materials and Devices Laboratory

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Home Transfer characteristics and bias-stress stability of amorphous indium zinc oxide thin-film transistors

Home Transfer characteristics and bias-stress stability of amorphous indium zinc oxide thin-film transistors

Transfer characteristics and bias-stress stability of amorphous indium zinc oxide thin-film transistors

저자

Jun Hyuk Choi et al.

저널 정보

Journal of Vacuum Science & Technology B

출간연도

2009

링크

https://doi.org/10.1116/1.3097852

Transfer characteristics and bias-stress stability of amorphous indium zinc oxide thin-film transistors