Two-Bit/Cell Characteristics of Silicon–Oxide–Nitride–Oxide–Silicon Flash Memory Devices with Recessed Channel Structure
저자
Kyoung-Rok Han et al.
저널 정보
Japanese Journal of Applied Physics
출간연도
2008
Two-Bit/Cell Characteristics of Silicon–Oxide–Nitride–Oxide–Silicon Flash Memory Devices with Recessed Channel Structure